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Wheat (Triticum aestivum L.) is one of the major food crops worldwide and Iran produces about 14 million tons of wheat annually. Effective interpretation of the data on breeding programmes is important at all stages of plant improvement. The cultivar by trait (CT) biplot was used for two-way wheat dataset as cultivars with multiple traits. For this propose, 13 wheat cultivars with specific characteristics were tested and the CT biplot for wheat dataset explained 65% of the total variation of the standardized data. The polygon view of CT presented for 18 different traits of wheat cultivars showed six vertex cultivars as G3, G4, G5, G9, G11 and G12. The cultivar G4 had the highest values for most of the measured traits. Generally based on vector view, ideal cultivar and ideal tester biplots, it was demonstrated that the selection of high grain yield will be performed via thousand seed weight, spike length and grain diameter. These traits should be considered simultaneously as effective selection criteria evolving high yielding wheat cultivars because of their large contribution to grain yield. The cultivars G3 and G4 could be considered for the developing of desirable progenies in the selection strategy of wheat improvement programmes
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