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K. Kalpanadevi, C. Sinduja and R. Manimekalai

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Ashok Borhade and Arun Dholi

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D. Bensaid, M. Ameri, M. El Hanani, Y. Azaz, D. Bendouma, Y. Al-Douri and I. Ameri

.D., Proc. Natl. Acad. Sci. USA, 30 (1944), 244. http://dx.doi.org/10.1073/pnas.30.9.244 [17] Dismuckes J.P., Ekstrom L., Poff R.J., J. Phys. Chem., 68 (1964), 3021. http://dx.doi.org/10.1021/j100792a049 [18] El Haj Hassan F., Akdarzadeh H., Mater. Sci. Eng. B, 121 (2005), 170. http://dx.doi.org/10.1016/j.mseb.2005.03.019 [19] Charifi Z., Baaziz H., El Haj Hassan F., Bouarissa N., J. Phys.-Condens. Mat., 17 (2005), 4083. http://dx.doi.org/10.1088/0953-8984/17/26/008 [20

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A. Borhade and S. Wakchaure

Doorn C.Z., Schipper D.J., Bolwijn P.T., J. Electrochem. Soc., 119 (1972), 85. http://dx.doi.org/10.1149/1.2404141 [7] Mclaughan S.D., Marshall D.J., Phys. Lett., 32A (1970), 343. [8] Bolwijn P.T., Schipper D.J., van Doorn C.Z., J. Appl. Phys., 43 (1972), 132. http://dx.doi.org/10.1063/1.1660796 [9] Kowalak S., Pawlowska M., Colloids surfaces A, Physico. Chem. Eng. Aspects, 101 (1995), 179. http://dx.doi.org/10.1016/0927-7757(95)03153-5 [10] Chang I., J

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Agnieszka Banaszak-Piechowska, Kazimierz Fabisiak, Elżbieta Staryga and Kazimierz Paprocki

X., CHEN D., Diam. Relat. Mater., 16 (2007), 454. [7] KAWARADA H., SASAKI H., SATO A., Phys. Rev. B, 52 (1995), 11351. [8] HAYASHI K., YAMANAKA S., WATANABE H., SEKIGUCHI T., OKUSHI H., KAJIMURA K., J. Appl. Phys., 81 (1997), 744. [9] HOFFMAN A., AKHVLEDIANI R., Diam. Relat. Mater., 14 (2005), 646. [10] GAN B., AHN J., RUSLI, ZHANG Q., YOON S., LIGATCHEV V., YU J., CHEW K., HUANG Q.-F., J. Appl. Phys., 89 (2001), 5747. [11] OLIVEIRA DE J., BERENGUE O., MORO J., FERREIRA N., CHIQUITO A

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Tadeusz Groń, Magdalena Piątkowska, Elżbieta Tomaszewicz, Bogdan Sawicki, Piotr Urbanowicz and Henryk Duda

References [1] N ovotny R., B eck R., D öring W., H ejny V., H ofstaetter A., K orzhik M., M etag V., R ömer K., S tröher H., Radiat. Meas., 33 (2001), 615. [2] K obayashi M., I shii M., U suki Y., Nucl. Instr. Meth. Phys. Res. A, 406 (1998), 442. [3] F eller R.P., G endner N., H olm U., J ohnson K.F., M eyer -L arsen A., T hies S., Nucl. Instr. Meth. Phys. Res. A, 486 (2002), 785. [4] L ecomte P., L uckey D., N essi -T edaldi F., P auss F., R enker D., Nucl. Instr. Meth. Phys. Res. A, 587 (2008), 266

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G.S. Orudzhev, N.A. Ismayilova and V.N. Jafarova

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G. Thilakavathi, R. Arun Kumar and V. Gunasekaran

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A. Sadoun, S. Mansouri, M. Chellali, N. Lakhdar, A. Hima and Z. Benamara

References [1] L akhdar N., D jeffal F., D ibi Z., AIP Conf. Proc. , 1292 (2010), 173. [2] L akhdar N., D jeffal F., Microelectron. Reliab. , 56 (2012), 958. [3] R avinandan M., R ao P.K., R eddy V.R., Semicond. Sci. Tech. , 24 (2009), 035004. [4] R eddy V.R., M anjunath V., J anardhanam V., K il Y.-H., C hoi C.-J., Electron. Mater. , 43 (2014), 3499. [5] Y ildirim N., E jderha K., T urut A., J. Appl. Phys. , 108 (2010), 114506. [6] A sha B., H arsha C. s ., P adma R., R eddy V.R., J. Electron. Mater

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Katarzyna Nowakowska-Langier, Rafal Chodun and Krzysztof Zdunek

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