Andrzej Sikora, Łukasz Bednarz, Tomasz Fałat, Marek Wałecki and Maria Adamowska
observation of specific submicron components behavior after specific exposition is applied.
It should be emphasized that the diversity of atomic force microscopy techniques (AFM) allows one to perform imaging of mechanical, magnetic, electrical, thermal and optical properties of the surface [ 1 ]. A number of observations of the morphology change due to the light/temperature or electrical field [ 6 – 10 ] have been performed. One has to be aware that significant variations of certain properties due to the local inhomogeneities of material can become an obstacle during the