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T. Miller, S. Adamczak, J. Świderski, M. Wieczorowski, A. Łętocha and B. Gapiński

Abstract

The paper presents an analysis of influence of ambient temperature changes on the values of parameters in topography measurements with the use of different profilometry techniques. In order to check this, a series of measurements was performed. Two multiprofilometry instruments were used - a contact profilometer, further equipped with an interferometric transducer, and an optical one with a confocal probe. Measurements were performed on first-class flat interferometric glass and on an A-type roughness standard - under different conditions, with simultaneous registration of differences in ambient temperature values. These values were either intentionally changed or the temperature variations were the result of air conditioning control. The performed research showed that - despite the asperities on the surface being really small - there is a relationship between changes of temperature and the results obtained from the measured surface, which in some cases can be seriously distorted.