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  • Author: M. Wieczorowski x
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Open access

P. Pawlus, R. Reizer, M. Wieczorowski and W. Żelasko

Abstract

Contact of random machined two-process steel textures with a smooth, flat steel surface is discussed in this paper. Two-process surfaces were machined by vapour blasting followed by lapping. An elastic-plastic contact model was applied, assuming distributed radius of asperities. Calculation procedures allowed the mean surface separation, contact pressure, and area fraction to be computed as functions of sampling intervals. Parameters characterizing the summits important in contact mechanics were calculated for different sampling intervals. Plasticity index of two-process textures was calculated using the modified procedure. It was found that the influence of sampling interval on normal contact depended on the rough surface ability to plastic deformation. The use of a traditional method of calculation overestimated the plasticity index. Peaks from plateau surface region governed contact characteristics of two-process surfaces.

Open access

T. Miller, S. Adamczak, J. Świderski, M. Wieczorowski, A. Łętocha and B. Gapiński

Abstract

The paper presents an analysis of influence of ambient temperature changes on the values of parameters in topography measurements with the use of different profilometry techniques. In order to check this, a series of measurements was performed. Two multiprofilometry instruments were used - a contact profilometer, further equipped with an interferometric transducer, and an optical one with a confocal probe. Measurements were performed on first-class flat interferometric glass and on an A-type roughness standard - under different conditions, with simultaneous registration of differences in ambient temperature values. These values were either intentionally changed or the temperature variations were the result of air conditioning control. The performed research showed that - despite the asperities on the surface being really small - there is a relationship between changes of temperature and the results obtained from the measured surface, which in some cases can be seriously distorted.