Search Results

1 - 2 of 2 items

  • Author: Jozef Mišík x
Clear All Modify Search
Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques

Abstract

(RE)BCO thin films prepared by PLD and MOCVD techniques were investigated to characterize structural defects - outgrowths in thin film. For this purpose SEM, EDX analysis and LSCM were used. Outgrowths are often penetrating into the thin films. Evident differences in chemical heterogeneity, outgrowth morphology and outgrowths density between PLD and MOCVD thin films were proven in this study.

Open access
Structural Analysis of Superconductors at MTF: A Review

Abstract

The activities of the young STU MTF research team focused on the material properties of superconductors were reviewed for the first time. We performed structural analyses on multiple types of superconducting tapes in order to get deeper insight into the correlation between their structure and electromagnetic properties, both experimentally and by modelling. We also addressed the joining of tapes by lead-free solders.

Open access