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Joanna Radomska

Summary

The paper discusses the subject of the strategy implementation and the operational risk that accompanies this stage of the strategic management process. The studies confirmed the existence of a relationship between the effectiveness of the strategy implementation and the operational risk aspects (including internal processes, systems, people and the environment). This indicates the role of risk aspects when implementing development concepts. Therefore it seems necessary to take these elements into account in the course of the strategic management process in order to achieve a greater effectiveness of the implementation work..

Open access

Joanna Radomska

Summary

The article describes the subject of approach to strategy based on the current classification differentiating five types of approach specified on the basis of three features relating to business environment, such as predictability (ability to forecast), malleability (ability to shape) and harshness (ability to survive). The research demonstrated the existence of a correlation between the approaches and the size of an enterprise, indicating that small organisations most often apply a classical and renewal strategy. Medium-sized companies, however, are characterised by a low pressure on visionary behaviour and the shaping of the boundaries of the business environment. They therefore select most often a classical and adaptive approach. Large enterprises, according to the assumptions made, most often demonstrate the ability to change the conditions of competitive struggle and create new markets by showing a visionary approach.

Open access

Izabela Stępinska, Mirosław Kozłowski, Joanna Radomska, Halina Wronka, Elżbieta Czerwosz and Kamil Sobczak

Abstract

In this paper various types of films made of carbon nanotubes (CNTs) are presented. These films were prepared on different substrates (Al2O3, Si n-type) by the two-step method. The two-step method consists of physical vapor deposition step, followed by chemical vapor deposition step (PVD/CVD). Parameters of PVD process were the same for all initial films, while the duration times of the second step - the CVD process, were different (15, 30 min.). Prepared films were characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM) and field emission (FE) measurements. The I-E and F-N characteristics of electron emission were discussed in terms of various forms of CNT films. The value of threshold electric field ranged from few V/μm (for CNT dispersed rarely on the surface of the film deposited on Si) up to ~20 V/μm (for Al2O3 substrate).