X-ray diffraction and x-ray absorption spectroscopy at the Cu K-edge were used to study the atomic structure in copper nitride (Cu3N) thin films. Textured nanocrystalline films are obtained upon dc magnetron sputtering on substrates heated at about 190 °C, whereas amorphous films having strongly disordered structure already in the second coordination shell of copper are deposited in the absence of heating.
X-ray absorption spectroscopy at the Cu K-edge is used to study X-ray induced photoreduction of copper oxide to metallic copper. Although no photoreduction has been observed in microcrystalline copper oxide, we have found that the photoreduction kinetics of nanocrystalline CuO depends on the crystallite size, temperature and pressure. The rate of photoreduction increases for smaller nanoparticles but decreases at low temperature and higher pressure.